4

Burn-in effect on yield

Year:
2000
Language:
english
File:
PDF, 194 KB
english, 2000
5

A review of error propagation analysis in systems

Year:
1983
Language:
english
File:
PDF, 575 KB
english, 1983
6

Detection and classification of defect patterns on semiconductor wafers

Year:
2006
Language:
english
File:
PDF, 2.75 MB
english, 2006
9

Reliability For High System Utilization

Year:
1991
Language:
english
File:
PDF, 2.38 MB
english, 1991
10

Optimal burn-in decision making

Year:
1998
Language:
english
File:
PDF, 97 KB
english, 1998
11

Design and performance analysis of consecutive-K-out-of-n structure

Year:
1990
Language:
english
File:
PDF, 1.08 MB
english, 1990
12

A general model of heterogeneous system lifetimes and conditions for system burn-in

Year:
2003
Language:
english
File:
PDF, 143 KB
english, 2003
13

Software reliability estimation: A realization of competing risk

Year:
1983
Language:
english
File:
PDF, 367 KB
english, 1983
14

Simulation properties of the Bayesian and maximum likelihood estimators of availability

Year:
1984
Language:
english
File:
PDF, 387 KB
english, 1984
17

A relation model of gate oxide yield and reliability

Year:
2004
Language:
english
File:
PDF, 550 KB
english, 2004
18

Reliability Importance and Invariant Optimal Allocation

Year:
2002
Language:
english
File:
PDF, 111 KB
english, 2002
21

Planning Simple Step-Stress Accelerated Life Tests Using Bayesian Methods

Year:
2012
Language:
english
File:
PDF, 499 KB
english, 2012
22

A Note on Heuristic Methods in Optimal System Reliability

Year:
1978
Language:
english
File:
PDF, 792 KB
english, 1978
30

Initial allocation compensation algorithm for redundancy allocation: The scanning heuristic

Year:
2008
Language:
english
File:
PDF, 177 KB
english, 2008
41

A nonparametric Bayes approach to decide system burn-in time

Year:
1997
Language:
english
File:
PDF, 132 KB
english, 1997
44

A unified model incorporating yield, burn-in, and reliability

Year:
2004
Language:
english
File:
PDF, 133 KB
english, 2004
45

An availability model for the evaluation of equipment alternatives

Year:
1983
Language:
english
File:
PDF, 697 KB
english, 1983
46

Use of the dirichlet process for reliability analysis

Year:
1994
Language:
english
File:
PDF, 318 KB
english, 1994
48

Application and analysis for a consecutive-k-out-of-n:G structure

Year:
1991
Language:
english
File:
PDF, 377 KB
english, 1991
50

Degradation models and implied lifetime distributions

Year:
2007
Language:
english
File:
PDF, 274 KB
english, 2007